Scanning Electron Microscopy

As an advanced analytical capability available to our clients, Southern Research utilizes an FEI XL30 Scanning Electron Microscope (SEM) equipped with both secondary and backscattered electron detectors and an EDAX Phoenix Energy Dispersive Spectrometer (EDS). The SEM is a valuable tool in providing analyses such as the determination of failure mode, analysis of material defects or contaminants, and analysis of microstructures and material characterization.

Our clients benefit from working with a highly skilled engineer with more than 15 years of experience in scanning electron microscopy, including material analysis and interpretation. Southern Research has proven experience and expertise in advising clients and formulating recommendations using the data supplied by this advanced technology. In addition, we have experience working with a wide range of materials in SEM analyses, including composites, metals, polymers, and ceramics.

Benefits and Applications

• Using a finely focused electron beam, the SEM can scan the surface of a sample to produce a highly magnified image from the beam-specimen interactions detected in several locations. The XL30 is capable of 100,000x and 3.5 nm resolution at 30kV and 20,000x and 20nm resolution at 1kV.
• At lower beam potentials, excellent topographic details can be obtained, while higher potentials yield optimum resolutions and efficient EDS analysis. The EDS system can be used to identify the major elements present in a sample in concentrations greater than about 1 wt% and can detect elements as low as carbon on the periodic table.
• The microscope is also equipped with a high-temperature heating stage for continuous in-situ imaging of live, dynamic heating experiments up to 1000°C in an inert, oxidizing, or reducing atmosphere. The combination of advanced, high-resolution imaging, elemental analysis, image manipulation, and hot-stage capabilities makes this a very powerful research tool.

Versatile Features

• Full range of environmental scanning electron microscopy (ESEM) capabilities including variable vacuum mode for analysis of nonconductive and high-vacuum incompatible samples
• Extra-large stage area for viewing larger specimens (up to 3" x 3" x 2.25")
• Large chamber and stage configuration with five-axis control of specimen positioning
• Enhanced image analysis and manipulation including:
• X-ray mapping of up to 16 elements simultaneously
• Calibrated distance measurements including height
• Multiple image montages
• Stereo pair images

XL-30 SEM Specifications

• Source
• Optimizing tungsten gun with low kV booster, 0.2-30 kV accelerating potential
• Resolution
• 3.5 nm at 30 kV, 20 nm at 1 kV
• Detectors
• SE, BSE, EDS, CCD camera
• Images
• Max 4k x 3k 8 bit grayscale saved as uncompressed image files
• Stage
• 100 mm X-Y travel, 1-60 mm Z travel, 360° rotation, -5° to 70° tilt, all five axes under computer control
• Hot Stage
• Max 1000°C, 1°/min to 300°/min (5°/sec), ± 25°
• Software
• Windows NT controls beam and stage, XL Docu image database management software, on-screen x-y measurements can be transferred to Excel datasheet