Microscopy

Southern Research provides expert microscopy services with diverse capabilities ranging from simple microstructural examinations to complex failure analysis investigations requiring a multi-disciplined approach. Our resources include state-of-the-art equipment and a nationally recognized engineering staff with extensive experience in material testing and failure analysis. In addition, Southern Research engineers and technicians have expertise with a variety of materials, including but not limited to: ferrous alloys, aluminum alloys, refractory metals, metal matrix composite (MMC) materials, ceramic matrix composite (CMC) materials, carbon phenolics, and carbon composites.

We offer three unique methods of material visualization:

• Light microscopy
• Digital microscopy
• Scanning electron microscopy (SEM)

Light Microscopy Features and Benefits

• Southern Research offers traditional light microscopy as well as stereomicroscopy
capabilities. Specimens are prepared for microstructural evaluation using standard metallography techniques. Both color and black-and-white digital cameras are available to capture images.
• The stereo microscope offers a magnification range of approximately 1x to 70x, and the inverted light microscope offers a magnification range of 10x to 1000x.
• Image analysis software can also be utilized for measurement of any surface or microstructural features as well as automatic generation of a seamless montage image.

Digital Microscopy Features and Benefits

• The Keyence VHX-600 digital microscope represents an advanced microscopy technique available to our clients. In contrast to an optical light microscope, the digital microscope offers a greater depth of field and working distance over a wide range of magnifications.
• The current magnification range of the system is 5x to 1000x. At 20x, the working distance is 1”, and the depth of field is 1.34”. In the range from 100x to 1000x, the working distance is 0.98”. These capabilities are well-suited to material characterization, defect analysis and failure analysis.
• The five-axis stand allows for manipulating the stage and digital microscope to change the viewing angle, instead of moving the specimen to obtain the desired view. This free-angle movement allows for 0° to 90° tilt of the digital microscope, providing diverse analytical capabilities.
• The microscope also has the capability to produce a z-stacked image. For example, if the entire field of view is not in focus due to excessive depth in the topography, the system can construct one entirely focused image. An additional result of this process is the creation of a 3D profile of the surface.

Scanning Electron Microscopy

• A fundamental component of our microscopy capabilities is the FEI XL30 Scanning Electron Microscope (SEM). Due to the system's diverse features, the SEM is an integral part of analyses of failure mode, material defects, and corrosion products and coatings as well as microstructure and material characterization.
• Integrated detectors allow for viewing of the specimen in various ways. The system includes an EDS detector for elemental analysis, a backscattered electron detector, and x-ray mapping (dot map) of up to 16 elements simultaneously.
• The SEM can also be operated in a variable vacuum mode for analysis of nonconductive and high-vacuum incompatible samples. In addition, a high-temperature hot stage can be utilized for in-situ heating experiments up to 1000°C.